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New Standards

EVS-EN 62137-3:2012
Price 14.64 EUR
Electronics assembly technology - Part 3: Selection guidance of environmental and endurance test methods for solder joints
This part of IEC 62137 describes the selection methodology of an appropriate test method for a reliability test for solder joints of various shapes and types of surface mount devices (SMD), array type devices and leaded devices, and lead insertion type devices using various types of solder material alloys.

Replaced Standards

EVS-EN 131700:2002
Sectional Specification: Fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric
This European Standard specifies requirements for fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. It specifies preferred ratings and characteristics and selects from EN 130000 the appropriate quality assessment procedures, tests and measuring methods and gives general performance requirements for this type of capacitor.
Language: English

EVS-EN 131802:2002
Blank Detail Specification: Fixed polypropylene film dielectric metal foil d.c. capacitors - Assessment level EZ
This European Standard specifies requirements for fixed capacitors for direct current, using as dielectric a polypropylene film and electrodes of thin metal foils. The capacitors covered by this specification are intended for use in electronic equipment.
Language: English

EVS-EN 143000:2005
Generic Specification: Thermistors

Language: English

EVS-EN 130502:2002
Blank Detail Specification: Fixed metallized polycarbonate film dielectric capacitors for direct current. Assessment level EZ
Blank detail specification.
Language: English

EVS-EN 131701:2002
Blank Detail Specification: Fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric - Assessment level E
This European Standard specifies requirements for fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. It specifies preferred ratings and characteristics and selects from EN 130000 the appropriate quality assessment procedures, tests and measuring methods and gives general performance requirements for this type of capacitor.
Language: English

EVS-EN 131702:2002
Blank Detail Specification: Fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric - Assessment level EZ
This European Standard specifies requirements for fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. It specifies preferred ratings and characteristics and selects from EN 130000 the appropriate quality assessment procedures, tests and measuring methods and gives general performance requirements for this type of capacitor.
Language: English

Drafts

prEN ISO 11553-3
Deadline 3/31/2012
Safety of machinery - Laser processing machines - Part 3: Noise reduction and noise measurement methods for laser processing machines and hand-held processing devices and associated auxiliary equipment (accuracy grade 2) (ISO/DIS 11553-3:2012)
This part of ISO 11553 describes the requirements to deal with noise hazards and specifies all the information necessary to carry out efficiently and under standardized conditions the determination, declaration and verification of airborne noise emission from laser processing machines and hand-held laser processing devices within the scope of ISO 11553-1 and ISO 11553-2. It specifies the safety requirements relating to noise hazards. It specifies noise measurement methods, installation and operating conditions to be used for the test together with the information to be supplied by manufacturers of such equipment. This part of ISO 11553 applies to those laser processing machines and hand-held laser processing devices included in the scope of ISO 11553-1 and ISO 11553-2. Noise emission characteristics include emission sound pressure levels at work stations and the sound power level. Declared noise emission values permit comparison of laser processing machines and hand-held laser processing devices on the market. The use of this noise test code ensures the reproducibility of the determination of the characteristic noise emission values within specific limits. These limits are determined by the accuracy grade of the noise emission measuring method used. Noise emission measurements specified by this part of ISO 11553 meet the requirements of an engineering method accuracy grade 2.
Language: English

FprEN 62679-3-2
Deadline 3/31/2012
Electronic paper display - Part 3-2: Measuring methods - Electro-optical
The scope of this document is restricted to electronic paper display modules using either segment, passive, or active matrix, and either monochromatic, or colour type displays. If electronic paper display module with combination of an external touch-key-panel or an external front-light-unit, remove those for measuring. If it is not possible to remove, it should be mentioned . However, it is not necessary to mention about protective sheet. This document shall be read together with other specifications to which it refers. It gives details of the quality assessment procedures, the inspection requirements, screening sequences, sampling requirements, and test and measurement procedures required for the assessment of electronic paper display modules. In order to achieve a useful and uniform description of the performance of these devices, specifications for commonly accepted relevant parameters are put forward. The purpose of this paper is to indicate and list the procedure-dependent parameters and to prescribe the specific methods and conditions that are to be used for their uniform numerical determination. It is assumed that all measurements are performed by personnel skilled in the general art of radiometric and electrical measurements as the purpose of this paper is not to give a detailed account of good practice in electrical and optical experimental physics. Furthermore, it must be assured that all equipment is suitably calibrated as is known to people skilled in the art and records of the calibration data and traceability are kept.
Language: English

FprEN 60469
Deadline 3/31/2012
Transitions, pulses and related waveforms - Terms, definitions and algorithms
This standard provides definitions of terms pertaining to transitions, pulses, and related waveforms and provides definitions and descriptions of techniques and procedures for measuring their parameters. The waveforms considered in this standard are those that make a number of transitions and that remain relatively constant in the time intervals between transitions. Signals and their waveforms for which this standard apply include but are not limited to those used in: digital communications, data communications, and computing; studies of transient biological, cosmological, and physical events; and electrical, chemical, and thermal pulses encountered and used in a variety of industrial, commercial, and consumer applications. This standard does not apply to sinusoidally-varying or other continuously-varying signals and their waveforms. The object of this standard is to facilitate accurate and precise communication concerning parameters of transitions, pulses, and related waveforms and the techniques and procedures for measuring them.
Language: English

FprEN 61924-2
Deadline 3/31/2012
Maritime navigation and radiocommunication equipment and systems - Integrated navigation systems (INS) - Part 2: Modular structure for INS - Operational and performance requirements, methods of testing and required test results
This part of IEC 61924 specifies the minimum requirements for the design, manufacture, integration, methods of testing and required test results for an integrated navigation system (INS) to comply with the International Maritime Organization (IMO) requirements of Resolution MSC.252(83). In addition it takes account of IMO Resolution A.694(17) to which IEC 60945 is associated. When a requirement in this standard is different from IEC 60945, the requirement of this standard takes precedence. NOTE IEC 61924 (2006) specifies the minimum requirements for the design, manufacture, integration, methods of testing and required test results for an integrated navigation system to comply with the earlier IMO requirements of Resolution MSC 86(70) Annex 3. Integrated navigation systems to IEC 61924 (2006) are not suitable for installation after 1 January 2011. All text of this standard, whose meaning is identical to that in IMO Resolution MSC.252(83) will be printed in italics and the Resolution and paragraph number indicated between brackets.
Language: English

FprEN 61747-4
Deadline 3/31/2012
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics
This part of IEC 61747 describes the essential ratings and characteristics of LCD cells and passive matrix monochrome liquid crystal display modules. It does not apply to active matrix LCD cells nor to multicolour cells.
Language: English

FprEN 62246-1-1
Deadline 3/31/2012
Reed switches - Part 1-1: Quality assessment specification
This part of the IEC 62246 which is a quality assessment specification defines requirements and tests to reed switches for use in general and industrial applications. This standard is only intended to be used in conjunction with IEC 62246-1. This standard selects from IEC 62246-1 and from other sources the appropriate test procedures to be used in detail specifications derived from this specification. Reed switch types are specified depending on characteristic values and tests.
Language: English

FprEN 62047-11
Deadline 3/31/2012
Semiconductor devices - Microelectromechanical devices - Part 11: Test method for linear thermal expansion coefficients of freestanding MEMS materials
This International Standard specifies the test method to measure the linear thermal expansion coefficients (CTE) of thin freestanding solid (metallic, ceramic, polymeric etc.) MEMS materials with length between 0,1 and 1 mm and width between 10 μm and 1 mm and thickness between 0,1 μm and 1 mm, which are main structural materials used for MEMS, micromachines and others. This test method is applicable for the CTE measurement in the temperature range from room temperature to 30 % of a material’s melting temperature.
Language: English

FprEN 60831-2
Deadline 3/31/2012
Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test, self-healing test and destruction test
This part of IEC 60831 applies to capacitors according to IEC 60831-1 and gives the requirements for the ageing test, self-healing test and destruction test for these capacitors.
Language: English

FprEN 62047-19
Deadline 3/31/2012
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
This international standard defines terms, definitions, essential ratings and characteristics, and measuring methods of electronic compasses. This standard applies to electronic compasses composed of magnetic sensors and acceleration sensors, or magnetic sensors alone. This standard applies to electronic compasses for mobile electronic equipment. For marine electronic compasses, see ISO 11606. Electronic compasses are called “e-compasses” for short. Types of e-compasses are: 2-axis e compasses, 3-axis e-compasses, 6-axis e-compasses, etc., all of which are covered by this standard.
Language: English