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Semiconductor die products -- Part 3: Recommendations for good practice in handling, packing and storage
Semiconductor die products -- Part 3: Recommendations for good practice in handling, packing and storage
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English
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Valid |
16.10 EUR |
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Semiconductor die products -- Part 4: Questionnaire for die users and suppliers
Semiconductor die products -- Part 4: Questionnaire for die users and suppliers
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English
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Withdrawn |
10.90 EUR |
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Semiconductor die products - Part 4: Questionnaire for die users and suppliers (IEC/TR 62258-4:2012)
Semiconductor die products - Part 4: Questionnaire for die users and suppliers (IEC/TR 62258-4:2012)
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English
|
Valid |
10.19 EUR |
|
Semiconductor die products -- Part 7: XML schema for data exchange
Semiconductor die products -- Part 7: XML schema for data exchange
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English
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Valid |
12.51 EUR |
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Semiconductor die products -- Part 8: EXPRESS model schema for data exchange
Semiconductor die products -- Part 8: EXPRESS model schema for data exchange
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English
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Valid |
12.51 EUR |
|
Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
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English
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Valid |
17.08 EUR |
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Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
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English
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Withdrawn |
18.00 EUR |
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Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
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English
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Valid |
12.51 EUR |
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Semiconductor devices - Part 16-1: Microwave integrated circuits -Amplifiers
Semiconductor devices - Part 16-1: Microwave integrated circuits -Amplifiers
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English
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Valid |
17.08 EUR |
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Semiconductor devices - Part 16-1: Microwave integrated circuits -Amplifiers
Semiconductor devices - Part 16-1: Microwave integrated circuits -Amplifiers
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|
English
|
Valid |
11.67 EUR |
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Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
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|
English
|
Valid |
11.67 EUR |
|
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
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English
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Valid |
7.38 EUR |
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Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
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English
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Valid |
10.19 EUR |
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Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
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English
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Valid |
6.47 EUR |
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
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English
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Valid |
12.51 EUR |
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Üldvalgustuse valgusdioodmoodulid. Ohutusnõuded
LED modules for general lighting - Safety specifications
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|
English
|
Valid |
10.90 EUR |
|
Üldvalgustuse valgusdioodmoodulid. Ohutusnõuded
LED modules for general lighting - Safety specifications (IEC 62031:2008/A1:2012)
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English
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Valid |
7.38 EUR |
|
Semiconductor devices - Micro-electromechanical devices Part 1: Terms and definitions
Semiconductor devices - Micro-electromechanical devices Part 1: Terms and definitions
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English
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Valid |
13.92 EUR |
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Semiconductor devices - Microelectromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Semiconductor devices - Microelectromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
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English
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Valid |
8.01 EUR |
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Semiconductor devices - Microelectromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Semiconductor devices - Microelectromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
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English
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Valid |
13.22 EUR |