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Staatus: KehtivKehtetuKavandParandus

Keel: KõikAinult eestikeelsed

Organisatsioon: ISOIECEesti standardid

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31 ELEKTROONIKA
1. 31.080 Pooljuhtseadised
  1. 31.080.01 Pooljuhtseadised üldiselt
  2. 31.080.10 Dioodid
  3. 31.080.20 Türistorid
  4. 31.080.30 Transistorid
  5. 31.080.99 Muud pooljuhtseadised

Formaat	Nimetus	Keel	Staatus
	EVS-EN 60191-4:2002 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages Vaata / Osta	Inglise	Kehtiv	12,51 EUR 195,74 EEK
	EVS-EN 60191-4:2002/A2:2003 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages Vaata / Osta	Inglise	Kehtiv	5,62 EUR 87,93 EEK
	EVS-EN 60749-21:2005 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability Vaata / Osta	Inglise	Kehtetu	11,67 EUR 182,60 EEK
	EVS-EN 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST Vaata / Osta	Inglise	Kehtiv	7,38 EUR 115,47 EEK
	EVS-EN 60749-29:2004 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test Vaata / Osta	Inglise	Kehtetu	16,10 EUR 251,91 EEK
	EVS-EN 60749-33:2004 Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave Vaata / Osta	Inglise	Kehtiv	7,38 EUR 115,47 EEK
	EVS-EN 60749-34:2004 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling Vaata / Osta	Inglise	Kehtetu	8,01 EUR 125,33 EEK
	EVS-EN 60821:2006 VMEbus - Microprocessor system bus for 1 byte to 4 byte data VMEbus - Microprocessor system bus for 1 byte to 4 byte data Vaata / Osta	Inglise	Kehtiv	33,25 EUR 520,25 EEK
	EVS-EN 62047-6:2010 Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials Vaata / Osta	Inglise	Kehtiv	10,19 EUR 159,44 EEK
	EVS-EN 62373:2008 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Vaata / Osta	Inglise	Kehtiv	10,19 EUR 159,44 EEK
	EVS-EN 62374:2007 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films Vaata / Osta	Inglise	Kehtetu	12,51 EUR 195,74 EEK
	EVS-EN 62374-1:2010 Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers Vaata / Osta	Inglise	Kehtiv	9,49 EUR 148,49 EEK
	EVS-EN 62374-1:2010/AC:2011 Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers Vaata / Osta	Inglise	Kehtiv	0,00 EUR 0,00 EEK
	EVS-EN 62415:2010 Semiconductor devices - Constant current electromigration test Semiconductor devices - Constant current electromigration test Vaata / Osta	Inglise	Kehtiv	7,38 EUR 115,47 EEK
	EVS-EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors Semiconductor devices - Hot carrier test on MOS transistors Vaata / Osta	Inglise	Kehtiv	7,38 EUR 115,47 EEK
	EVS-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) Vaata / Osta	Inglise	Kehtiv	7,38 EUR 115,47 EEK
	EVS-EN 62418:2010 Semiconductor devices - Metallization stress void test Semiconductor devices - Metallization stress void test Vaata / Osta	Inglise	Kehtiv	9,49 EUR 148,49 EEK
	IEC 60050-521:2002 International Electrotechnical Vocabulary - Part 521: Semiconductor devices and integrated circuits International Electrotechnical Vocabulary - Part 521: Semiconductor devices and integrated circuits Vaata / Osta	Inglise	Kehtiv	234,45 EUR 3 668,35 EEK
	IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices Rating systems for electronic tubes and valves and analogous semiconductor devices Vaata / Osta	Inglise	Kehtiv	14,81 EUR 231,73 EEK
	IEC 60191-4/Amd 2:2002 Amendment 2 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages Amendment 2 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages Vaata / Osta	Inglise	Kehtiv	11,52 EUR 180,25 EEK

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