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EVS-EN ISO 11562:1999

Geometrical product specifications (GPS) - Surface texture: Profile method - Metrological characteristics of phase correct filters

General information

Withdrawn from 05.09.2012
Base Documents
ISO 11562:1996; EN ISO 11562:1997
Directives or regulations
None

Standard history

Status
Date
Type
Name
07.11.2008
Corrigendum
EVS-EN ISO 11562:1999/AC:2008
Main
EVS-EN ISO 11562:1999
Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.

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