Skip to main content
Back

EVS-EN 60444-2:2002

Measurement of quartz crystal unit parameters by zero phase technique in a PI-Network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

General information

Valid from 01.01.2003
Base Documents
IEC 60444-2:1980; EN 60444-2:1997
Directives or regulations
None

Standard history

Status
Date
Type
Name
01.01.2003
Main
This standard describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%. The advantage of this method is that it uses only the measuring circuit described in IEC Publication 444 and therefore avoids the use of additional elements or instruments which could be sources of error.

Required fields are indicated with *

*
*
*
PDF
12.20 € incl tax
Paper
12.20 € incl tax
Browse standard from 2.44 € incl tax
Standard monitoring