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EVS-EN 60444-6:2002

Measurement of quartz crystal unit parameters - part 6: Measurement of drive level dependence (DLD)

General information
Withdrawn from 14.11.2013
Base Documents
IEC 60444-6:1995; EN 60444-6:1997
Directives or regulations
None

Standard history

Status
Date
Type
Name
14.11.2013
Main
01.01.2003
Main
EVS-EN 60444-6:2002
This part of IEC 444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods are described. Method A, based on the pi-network method according to IEC 444-1, can be used in the complete frequency range covered by this part of IEC 444. Method B, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
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