Back

EVS-EN 60444-6:2013

Measurement of quartz crystal unit parameters -- Part 6: Measurement of drive level dependence (DLD)

General information
Withdrawn from 15.10.2021
Base Documents
IEC 60444-6:2013; EN 60444-6:2013
Directives or regulations
None

Standard history

Status
Date
Type
Name
15.10.2021
Main
14.11.2013
Main
01.01.2003
Main
EVS-EN 60444-6:2002
IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
*
*
*
PDF
17.08 € incl tax
Paper
17.08 € incl tax
Browse standard from 2.44 € incl tax
Standard monitoring