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EVS-EN 60749-1:2003

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

General information
Valid from 07.11.2003
Base Documents
IEC 60749-1:2002; EN 60749-1:2003
Directives or regulations
None

Standard history

Status
Date
Type
Name
07.11.2003
Main
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series
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