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EVS-EN 60749-27:2006

Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

General information
Valid from 06.10.2006
Base Documents
IEC 60749-27:2006; EN 60749-27:2006
Directives or regulations
None

Standard history

Status
Date
Type
Name
05.12.2012
Amendment
06.10.2006
Main
This part of IEC 60749 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed.
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