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EVS-EN 60749-32:2003/A1:2010

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

General information
Valid from 04.11.2010
Base Documents
IEC 60749-32:2002/A1:2010; EN 60749-32:2003/A1:2010
Directives or regulations
None

Standard history

Status
Date
Type
Name
04.11.2010
Amendment
07.11.2003
Main
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating.  The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device
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