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EVS-EN IEC 60749-20:2020

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

General information

Valid from 15.10.2020
Base Documents
EN IEC 60749-20:2020; IEC 60749-20:2020
ICS Groups
31.080.01 Semiconductor devices in general
Directives or regulations
None

Standard history

Status
Date
Type
Name
15.10.2020
Main
EVS-EN IEC 60749-20:2020
06.01.2010
Main
EVS-EN 60749-20:2009
IEC 60749-20:2020 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive.
This edition includes the following significant technical changes with respect to the previous edition:
- incorporation of a technical corrigendum to IEC 60749-20:2008 (second edition );
- inclusion of new Clause 3;
- inclusion of explanatory notes.

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English (PDF 1 MB)

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Main

EVS-EN IEC 60747-5-5:2020

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Main

EVS-EN 60749-34:2010

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Newest version Valid from 05.01.2011
Amendment

EVS-EN 60747-5-5:2011/A1:2015

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
Withdrawn from 02.10.2020
Main

EVS-EN IEC 60749-26:2018

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Newest version Valid from 02.04.2018

Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English