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EVS-EN IEC 62819:2023

Live working - Eye, face and head protectors against the effects of electric arc - Performance requirements and test methods

General information
Valid from 01.06.2023
Base Documents
IEC 62819:2022; EN IEC 62819:2023
Directives or regulations
None

Standard history

Status
Date
Type
Name
01.06.2023
Main
This part of IEC 63275-1 gives a test method to evaluate gate threshold voltage shift of silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (MOSFETs) using room temperature readout after applying continuous positive gate-source voltage stress at elevated temperature. The proposed method accepts a certain amount of recovery by allowing large delay times between stress and measurement (up to 10h).
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