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IEC 60747-5-3:1997

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

General information

Withdrawn from 26.03.2016
Directives or regulations
None

Standard history

Status
Date
Type
Name
13.05.2013
Amendment
IEC 60747-5-5/Amd 1:2013
26.09.2007
Main
23.02.2006
Main
Main
IEC 60747-5-3:1997
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

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