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IEC 60747-5-3:2009

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

General information
Withdrawn from 26.03.2016
Directives or regulations
None
Standard history
Status
Date
Type
Name
13.05.2013
Amendment
26.09.2007
Main
23.02.2006
Main
IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (2002). Therefore, no need to order amendment in addition to this publication. This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.
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