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IEC 60749-11:2002/COR2:2003

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

General information

Valid from 13.08.2003
Directives or regulations
None

Standard history

Status
Date
Type
Name
13.08.2003
Corrigendum
Modification of the validity date: now put at 2007.

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