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IEC 60749-4:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

General information

Withdrawn from 03.03.2017
Directives or regulations
None

Standard history

Status
Date
Type
Name
03.03.2017
Main
Modification of the validity date: now put at 2007.

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