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IEC 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

General information
Withdrawn from 25.08.2021
Directives or regulations
None

Standard history

Status
Date
Type
Name
15.06.2017
Main
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
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PDF
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Paper
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