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IEC 62899-503-1:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

General information
Valid from 27.05.2020
Directives or regulations
None
Standard history
Status
Date
Type
Name
27.05.2020
Main
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
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