Back

IEC/TR 62878-2-2:2015

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

General information
Valid from 04.12.2015
Directives or regulations
None
Standard history
Status
Date
Type
Name
04.12.2015
Main
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
*
*
*
PDF
77.77 € incl tax
Paper
77.77 € incl tax
Standard monitoring