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IEC TS 62607-6-11:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

General information
Valid from 08.02.2022
Directives or regulations
None
Standard history
Status
Date
Type
Name
08.02.2022
Main
IEC TS 62607-6-11:2022 establishes a standardized method to determine the key control characteristic • defect density nD of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by • Raman spectroscopy
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