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prEN 61967-4:2020

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

General information
Draft
Base Documents
prEN 61967-4:2020; 47A/1100/CDV
Directives or regulations
None

Standard history

Status
Date
Type
Name
Main
prEN 61967-4:2020
02.08.2017
Corrigendum
03.04.2009
Corrigendum
05.07.2006
Amendment
01.03.2003
Main
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results.
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