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prEN IEC 60749-5:2022

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

General information
Draft
Base Documents
47/2770/CDV; prEN IEC 60749-5:2022
Directives or regulations
None
Standard history
Status
Date
Type
Name
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive.
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