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prEN IEC 63287-2:2021

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

General information
Draft
Base Documents
IEC 63287-2 ED1; prEN IEC 63287-2:2021
Directives or regulations
None
Standard history
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Date
Type
Name
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
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