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CEN/TR 10354:2011

Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry

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Kehtiv alates 05.12.2011
Alusdokumendid
CEN/TR 10354:2011
Tegevusala (ICS grupid)
77.080.10 Malmid
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puuduvad
Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
05.12.2011
Põhitekst
This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials. The method is applicable to: - Si contents between 40 % and 90 %; - Al contents between 0,5 % and 6 %. The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines: - Si Kα 7.126 (for element contents between 45 % and 90 %); - Al Kα 8.339 (for element contents between 0,8 % and 6 %); - Fe Kα 1.937 (for element contents between 10 % and 58 %). NOTE For matrix matching purposes, iron is included in the analytical program to be prepared. Within the conditions here above, spectral interferences don’t need to be calculated.
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