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EVS-EN 60749-30:2005/A1:2011

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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Kehtetu alates 02.10.2020
Alusdokumendid
IEC 60749-30:2005/A1:2011; EN 60749-30:2005/A1:2011
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
02.10.2020
Põhitekst
03.08.2011
Muudatus
05.06.2005
Põhitekst
Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation. These SMDs should be subjected to the appropriate preconditioning sequence described in this standard prior to being submitted to specific in-house reliability testing in order to evaluate long term reliability.
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