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EVS-EN 60749-39:2006

Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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Kehtetu alates 01.02.2022
Alusdokumendid
IEC 60749-39:2006; EN 60749-39:2006
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Staatus
Kuupäev
Tüüp
Nimetus
01.02.2022
Põhitekst
06.10.2006
Põhitekst
This part of IEC 60749 details the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.
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