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EVS-EN 60749-9:2003

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

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Kehtetu alates 05.07.2017
Alusdokumendid
IEC 60749-9:2002; EN 60749-9:2002
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
05.07.2017
Põhitekst
01.03.2003
Põhitekst
Aims at testing and verifying that the markings on  semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.
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