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EVS-EN 62132-1:2006

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 1: General conditions and definitions

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Kehtetu alates 04.04.2016
Alusdokumendid
IEC 62132-1:2006; EN 62132-1:2006
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puuduvad
Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
04.04.2016
Põhitekst
03.04.2009
Parandus
05.05.2006
Põhitekst
This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s).
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