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EVS-EN 62132-1:2016

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

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Kehtiv alates 04.04.2016
Alusdokumendid
EN 62132-1:2016; IEC 62132-1:2015
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Staatus
Kuupäev
Tüüp
Nimetus
04.04.2016
Põhitekst
03.04.2009
Parandus
05.05.2006
Põhitekst
This part of IEC 62132 provides general information and definitions about measurement of
electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances.
It also defines general test conditions, test equipment and setup, as well as the test
procedures and content of the test reports that shall be applied to all parts of IEC 62132. Test
method comparison tables are included in Annex A to assist in selecting the appropriate
measurement method(s).
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