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EVS-EN 62228-2:2017

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

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Kehtiv alates 02.03.2017
Alusdokumendid
IEC 62228-2:2016; EN 62228-2:2017
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Nimetus
02.03.2017
Põhitekst
IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers: - the emission of RF disturbances, - the immunity against RF disturbances, - the immunity against impulses and - the immunity against electrostatic discharges (ESD).
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