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EVS-EN 62276:2016

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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Kehtiv alates 03.01.2017
Alusdokumendid
IEC 62276:2016; EN 62276:2016
Tegevusala (ICS grupid)
31.140 Piesoelektrilised seadised
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Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
03.01.2017
Põhitekst
05.02.2013
Põhitekst
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.
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