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IEC 60748-20-1:1994

Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

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Kehtiv alates 01.03.1994
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Staatus
Kuupäev
Tüüp
Nimetus
01.03.1994
Põhitekst
The purpose of these examinations is to check the internal
materials, construction and workmanship of film and hybrid
integrated circuits (F and HFICs).
These examinations will normally be used prior to tapping or
encapsulation to detect and eliminate the F and HFICs with internal
defects that could lead to device failure in normal application.
Other acceptance criteria may be agreed upon with the purchaser or
supplier, respectively.

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