Tagasi

IEC 62951-2:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

Üldinfo
Kehtiv alates 17.04.2019
Tegevusala (ICS grupid)
31.080.99 Muud pooljuhtseadised
Direktiivid või määrused
puuduvad
Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
17.04.2019
Põhitekst
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin‑film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.
*
*
*
PDF
44,45 € koos KM-ga
Paber
44,45 € koos KM-ga
Standardi monitooring