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IEC/TR 62878-2-2:2015

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

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Kehtiv alates 04.12.2015
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04.12.2015
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IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
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