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IEC TS 63202-2:2021

Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells

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Kehtiv alates 16.12.2021
Tegevusala (ICS grupid)
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16.12.2021
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IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.
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