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ISO 10810:2010

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis

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Kehtetu alates 22.08.2019
Tegevusala (ICS grupid)
71.040.40 Keemiline analüüs
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puuduvad
Standardi ajalugu
Staatus
Kuupäev
Tüüp
Nimetus
22.08.2019
Põhitekst
16.11.2010
Põhitekst
ISO 10810:2010 is intended to aid the operators of X-ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.
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