Tagasi

ISO 13083:2015

Surface chemical analysis -- Scanning probe microscopy -- Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

Üldinfo
Kehtiv alates 20.08.2015
Tegevusala (ICS grupid)
71.040.40 Keemiline analüüs
Direktiivid või määrused
puuduvad

Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
20.08.2015
Põhitekst
ISO 13083:2015 describes a method for measuring the spatial (lateral) resolution of scanning capacitance microscopes (SCMs) or scanning spreading resistance microscopes (SSRMs), which are widely used in imaging the distribution of carriers and other electrical properties in semiconductor devices. The method involves the use of a sharp-edged artefact.
*
*
*
PDF
125,87 € koos KM-ga
Paber
125,87 € koos KM-ga
Standardi monitooring