Tagasi

Vabandust – see toode pole enam saadaval

prEN IEC 61967-8:2022

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

Üldinfo
Kavand
Alusdokumendid
47A/1141/CDV; prEN IEC 61967-8:2022
Direktiivid või määrused
puuduvad

Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
Põhitekst
prEN IEC 61967-8:2022
02.11.2011
Põhitekst
This measurement procedure defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
*
*
*
PDF
5,49 € koos KM-ga
Paber
5,49 € koos KM-ga
Standardi monitooring