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prEN IEC 61967-8:2022

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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Alusdokumendid
47A/1141/CDV; prEN IEC 61967-8:2022
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Staatus
Kuupäev
Tüüp
Nimetus
02.11.2011
Põhitekst
This measurement procedure defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
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