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EVS-EN IEC 61076-2-118:2026
Connectors for electrical and electronic equipment - Product requirements - Part 2-118: Circular connectors - Detail specification for shielded and unshielded, free and fixed connectors with bayonet-locking size B12, B17, B23 and B40, for power, signal and data transmission
Scope:
This part of IEC 60679 describes the general properties, performance characteristics and usage precautions for quartz crystal oscillators. This document mainly describes crystal oscillators, but some descriptions also apply to oscillators other than crystal units (e.g. MEMS resonators). This part of IEC 61076 specifies circular connectors with bayonet locking size B12, B17, B23 and B40, typically used for power, signal and data transmissions in industrial applications.
These connectors consist of fixed and free connectors either rewirable or non-rewirable.
NOTE B indicates that the connector is equipped with bayonet locking, while 12, 17, 23, 40 are the approximate dimensions in millimetres of the contact carrier diameter of these circular connectors.
Power contacts of male connectors are round contacts with Ø 1 mm, Ø 1,5 mm, Ø 1,8 mm, Ø 2,25 mm and Ø 4 mm, with current ratings up to 64 A per pole and rated voltage of 50 V, 300 V or 600 V AC/DC. Power contact groups are classified by type and identified throughout this document as “P” followed by two digits “01” through “09” (see 4.3, Table 1).
Signal contacts of male connectors are round contacts with Ø 1 mm and Ø 1,8 mm, with current ratings up to 20 A per pole and rated voltage of 50 V AC/DC. Signal contact groups are classified by type and identified throughout this document as “S” followed by “0”, “1”, or “2” (see 4.3, Table 2).
Male data contacts are round with Ø 0,8 mm and Ø 1 mm, with current ratings up to 4 A and rated voltage of 50 V AC/DC, Data modules are classified by type and identified throughout this document as “D” followed by “1”, or “2” (see 4.3, Table 3). D1 modules provide data transmission with frequencies from 1 MHz to 100 MHz; D2 modules provide data transmission with frequencies from 0,1 MHz to 600 MHz.
Besides the size of their bayonet locking (B12, B17, B23 or B40), connectors according to this document can be identified by data module (D) and complementing power (P) and signal (S) contact groups and optionally by number of poles, and finally by their application.
These connectors are designated for two main target applications, which differ as follows:
– Application A is for data transmission with power over data.
– Application B is for data transmission without power over data.
Connectors with power, signal and data contacts of the same gender are intended to also
transmit power over the data contacts (application A), while connectors with data contacts not of the same gender of power and signal contacts are not intended to transmit power over the data contacts (application B).
The codings provided by this document prevent the mating to any other connector with similarly sized interfaces covered by this document.
These connectors consist of fixed and free connectors either rewirable or non-rewirable.
NOTE B indicates that the connector is equipped with bayonet locking, while 12, 17, 23, 40 are the approximate dimensions in millimetres of the contact carrier diameter of these circular connectors.
Power contacts of male connectors are round contacts with Ø 1 mm, Ø 1,5 mm, Ø 1,8 mm, Ø 2,25 mm and Ø 4 mm, with current ratings up to 64 A per pole and rated voltage of 50 V, 300 V or 600 V AC/DC. Power contact groups are classified by type and identified throughout this document as “P” followed by two digits “01” through “09” (see 4.3, Table 1).
Signal contacts of male connectors are round contacts with Ø 1 mm and Ø 1,8 mm, with current ratings up to 20 A per pole and rated voltage of 50 V AC/DC. Signal contact groups are classified by type and identified throughout this document as “S” followed by “0”, “1”, or “2” (see 4.3, Table 2).
Male data contacts are round with Ø 0,8 mm and Ø 1 mm, with current ratings up to 4 A and rated voltage of 50 V AC/DC, Data modules are classified by type and identified throughout this document as “D” followed by “1”, or “2” (see 4.3, Table 3). D1 modules provide data transmission with frequencies from 1 MHz to 100 MHz; D2 modules provide data transmission with frequencies from 0,1 MHz to 600 MHz.
Besides the size of their bayonet locking (B12, B17, B23 or B40), connectors according to this document can be identified by data module (D) and complementing power (P) and signal (S) contact groups and optionally by number of poles, and finally by their application.
These connectors are designated for two main target applications, which differ as follows:
– Application A is for data transmission with power over data.
– Application B is for data transmission without power over data.
Connectors with power, signal and data contacts of the same gender are intended to also
transmit power over the data contacts (application A), while connectors with data contacts not of the same gender of power and signal contacts are not intended to transmit power over the data contacts (application B).
The codings provided by this document prevent the mating to any other connector with similarly sized interfaces covered by this document.
Base documents:
IEC 61076-2-118:2026; EN IEC 61076-2-118:2026
EVS-EN IEC 60679-2:2026
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 2: Guidelines for the use of oscillators
Scope:
This part of IEC 60679 describes the general properties, performance characteristics and usage precautions for quartz crystal oscillators. This document mainly describes crystal oscillators, but some descriptions also apply to oscillators other than crystal units (e.g. MEMS resonators).
Base documents:
IEC 60679-2:2026; EN IEC 60679-2:2026
EVS-EN IEC 62146-1:2026
Capacitors for high-voltage alternating current circuit-breakers - Part 1: General and grading capacitors
Scope:
This part of IEC 62146 includes generalities of capacitors used on alternating current circuit breakers and introduces specifications for grading capacitors. Regarding grading capacitors, their function is to control the voltage distribution across the individual interrupter units of a multi-break circuit-breaker.
Capacitors can also be used in parallel to the interrupter unit on single break circuit-breakers to modify the Transient Recovery Voltage (TRV). This TRV capacitor application is covered by IEC 62146-2:2023.
Capacitors for high-voltage alternating circuit breakers are sub-components for the circuit breaker and are specified in accordance with the circuit-breaker specifications according to IEC 62271-1, IEC 62271-100, and if applicable to IEC 62271-203.
This document applies to grading capacitors falling into one or both of the following categories for:
− mounting on air-insulated circuit-breakers.
− mounting on enclosed circuit-breakers (for example immersed in insulating gas, in oil, etc.).
The testing for each of the above applications is in some cases different.
The object of this document is:
− to define uniform rules regarding performances, testing and rating;
− to define specific safety rules;
− to provide a guidance for installation and operation.
NOTE CIGRÉ TB-368 presents a study about the operating environment of voltage grading capacitors applied to high-voltage circuit-breakers (see [2]1).
This document does not apply to capacitors not directly associated with high-voltage alternating current circuit-breakers.
Capacitors can also be used in parallel to the interrupter unit on single break circuit-breakers to modify the Transient Recovery Voltage (TRV). This TRV capacitor application is covered by IEC 62146-2:2023.
Capacitors for high-voltage alternating circuit breakers are sub-components for the circuit breaker and are specified in accordance with the circuit-breaker specifications according to IEC 62271-1, IEC 62271-100, and if applicable to IEC 62271-203.
This document applies to grading capacitors falling into one or both of the following categories for:
− mounting on air-insulated circuit-breakers.
− mounting on enclosed circuit-breakers (for example immersed in insulating gas, in oil, etc.).
The testing for each of the above applications is in some cases different.
The object of this document is:
− to define uniform rules regarding performances, testing and rating;
− to define specific safety rules;
− to provide a guidance for installation and operation.
NOTE CIGRÉ TB-368 presents a study about the operating environment of voltage grading capacitors applied to high-voltage circuit-breakers (see [2]1).
This document does not apply to capacitors not directly associated with high-voltage alternating current circuit-breakers.
Base documents:
IEC 62146-1:2026; EN IEC 62146-1:2026
EVS-EN IEC 63287-4:2026
Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
Scope:
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the early failure assessment, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space related applications.
Base documents:
IEC 63287-4:2026; EN IEC 63287-4:2026
IEC 62906-5-8:2026
Laser displays - Part 5-8: Measurement of scanning characteristics for raster-scanning laser display
Scope:
IEC 62906-5-8:2026 specifies the standard measurement conditions and methods of scanning characteristics for raster-scanning laser display which uses a MEMS mirror as optical scanner and is designed for projection onto a flat screen.
Base documents:
IEC 62813:2025/COR1:2026
Corrigendum 1 - Lithium ion capacitors for use in electric and electronic equipment - Test methods for electrical characteristics
Scope:
Corrigendum for IEC 62813:2025
Base documents:
IEC TR 62240-2:2026
Process management for avionics - Electronic components capability in operation - Part 2: Semiconductor microcircuit lifetime
Scope:
IEC TR 62240-2:2026 focuses on original equipment manufacturers (OEMs) using commercial off the shelf (COTS) semiconductor microcircuits for high performance, high reliability and long duration applications. This document supports OEMs in the preparation and maintenance of their semiconductor electronic component management plan (ECMP). IEC TR 62240-2:2026 describes a process and a method for selecting digital semiconductor microcircuits by ensuring that their lifetime is compatible with the requirements of aerospace, defence and high performance (ADHP) applications (generally in connection with functional environments). Methods and guidelines are provided to assess the long-term reliability of COTS semiconductor microcircuits in such applications; they mainly apply during the electronic design phase when selecting semiconductor microcircuits and assessing the application reliability. Moreover, this document focuses on the intrinsic wear-out and the lifetime of COTS semiconductor microcircuits processed of less than or equal to 90 nm feature size (also called deep sub-micron (DSM) semiconductor microcircuits) and puts aside, at this time, packaging wear-out and random failure mechanisms. In this view, physics of failure (PoF) is at the heart of the approach.
This edition includes the following significant technical changes with respect to the previous edition:
a) introduction of an additional alternative path and approach where lifetime is assessed by the original component manufacturer based on user or original equipment manufacturer microcircuit mission profile;
b) update of Figure 1 with regard to the introduction of the additional alternative path & approach;
c) removal of the mention of SiC & GaN technologies from the considerations in 4.2.2 as the Scope indicates that the principles (process and method) described in this document can be applied to all types of semiconductor technologies.
This edition includes the following significant technical changes with respect to the previous edition:
a) introduction of an additional alternative path and approach where lifetime is assessed by the original component manufacturer based on user or original equipment manufacturer microcircuit mission profile;
b) update of Figure 1 with regard to the introduction of the additional alternative path & approach;
c) removal of the mention of SiC & GaN technologies from the considerations in 4.2.2 as the Scope indicates that the principles (process and method) described in this document can be applied to all types of semiconductor technologies.
Base documents:
Replaces:
IEC TR 62240-2:2018
Replaced standards
EVS-EN 62146-1:2014/A1:2016
Grading capacitors for high-voltage alternating current circuit-breakers - Part 1: General
Scope:
Amendment for EN 62146-1:2014
Base documents:
IEC 62146-1:2013/A1:2016; EN 62146-1:2014/A1:2016
Replaced:
EVS-EN IEC 62146-1:2026
EVS-EN 62146-1:2014
Grading capacitors for high-voltage alternating current circuit-breakers -- Part 1: General
Scope:
IEC 62146-1:2013 is applicable to grading capacitors used on circuit-breakers. Their function is to control the voltage distribution across the individual interrupter units of a multi-break circuit-breaker. Grading capacitors can also be used in parallel to the interrupter unit on single break circuit-breakers to modify the Transient Recovery Voltage (TRV). The grading capacitor is a sub-component for the circuit-breaker and shall be specified in accordance with the circuit-breaker specifications. This standard applies to grading capacitors falling into one or both of the following categories for:
- mounting on air-insulated circuit-breakers;
- mounting on enclosed circuit-breakers (for example immersed in SF6, in oil, etc.). The testing for each of the above applications is in some cases different. The object of this standard is:
- to define uniform rules regarding performances, testing and rating;
- to define specific safety rules;
- to provide a guidance for installation and operation. Keywords: grading capacitors, circuit-breakers
- mounting on air-insulated circuit-breakers;
- mounting on enclosed circuit-breakers (for example immersed in SF6, in oil, etc.). The testing for each of the above applications is in some cases different. The object of this standard is:
- to define uniform rules regarding performances, testing and rating;
- to define specific safety rules;
- to provide a guidance for installation and operation. Keywords: grading capacitors, circuit-breakers
Base documents:
IEC 62146-1:2013; EN 62146-1:2014
Replaced:
EVS-EN IEC 62146-1:2026
IEC TR 62240-2:2018
Process management for avionics – Electronic components capability in operation – Part 2: Semiconductor microcircuit lifetime
Scope:
IEC TR 62240-2:2018(E) describes a process and a method for selecting digital semiconductor microcircuits by ensuring that their lifetime is compatible with the requirements of aerospace, defence and high performance (ADHP) applications (generally in connection with functional environments). Methods and guidelines are provided to assess the long term reliability of COTS semiconductor microcircuits in such applications; they mainly apply during the electronic design phase when selecting semiconductor microcircuits and assessing the application reliability. focuses on original equipment manufacturers (OEMs) using commercial off the shelf (COTS) semiconductor microcircuits for high performance, high reliability and long duration applications. This document supports OEMs in the preparation and maintenance of their semiconductor electronic component management plan (ECMP).
Base documents:
Replaced:
IEC TR 62240-2:2026
Drafts
prEN IEC 61076-3-122:2026
Connectors for electrical and electronic equipment - Product requirements - Part 3-122: Detail specification for 8-way, shielded, free and fixed connectors for i/o and data transmission with frequencies up to 500 MHz and current-carrying capacity in industrial environments
Scope:
This part of IEC 61076 covers 8-way, shielded, free and fixed rectangular connectors for I/O and data transmission with frequencies up to 500 MHz. It is intended to specify the common dimensions, mechanical, electrical and environmental characteristics and tests for this family of connectors.
Connectors complying with this document provide an ingress protection level of IP20; however, they are particularly suited for industrial environments with a high level of vibration.
NOTE 1 In terms of the MICE system as defined in ISO/IEC 11801-1, the connector matches the requirements of the M3I1C3E3 levels.
There are two classes of connectors defined in this document, indicated by "class A" and "class B" which are distinguished by some electrical and mechanical characteristics to meet the particular sets of requirements of some industrial applications.
NOTE 2 Class A meets the requirements defined in Ed.1 of this document.
NOTE 3 With the two classes A and B, the two codings Type I and II, and the two sets of transmission requirements according to the component categories Cat 5 and Cat 6A as defined in ISO/IEC 11801-1, this document specifies 2 × 2 × 2 = 8 variants.
All connectors covered by this document feature a current-carrying capacity beyond the minimum requirement of 0,75 A per pin for an ambient temperature of 60° C as defined in ISO/IEC 11801-1.
NOTE 4 The current-carrying capacity is given by the current-temperature derating defined in this document and is dependent on the wire size of the cable attached to the connector.
NOTE 5 With a current-carrying capacity of 0,5 A per pin and with matching the requirement of withstanding the test current of 2 A for unmating under load as defined in IEC 60512-99-002, the connectors covered by this document support the highest Power over Ethernet level as defined by IEEE 802.3bt (100 W PoE++ Type 4).
Connectors complying with this document provide an ingress protection level of IP20; however, they are particularly suited for industrial environments with a high level of vibration.
NOTE 1 In terms of the MICE system as defined in ISO/IEC 11801-1, the connector matches the requirements of the M3I1C3E3 levels.
There are two classes of connectors defined in this document, indicated by "class A" and "class B" which are distinguished by some electrical and mechanical characteristics to meet the particular sets of requirements of some industrial applications.
NOTE 2 Class A meets the requirements defined in Ed.1 of this document.
NOTE 3 With the two classes A and B, the two codings Type I and II, and the two sets of transmission requirements according to the component categories Cat 5 and Cat 6A as defined in ISO/IEC 11801-1, this document specifies 2 × 2 × 2 = 8 variants.
All connectors covered by this document feature a current-carrying capacity beyond the minimum requirement of 0,75 A per pin for an ambient temperature of 60° C as defined in ISO/IEC 11801-1.
NOTE 4 The current-carrying capacity is given by the current-temperature derating defined in this document and is dependent on the wire size of the cable attached to the connector.
NOTE 5 With a current-carrying capacity of 0,5 A per pin and with matching the requirement of withstanding the test current of 2 A for unmating under load as defined in IEC 60512-99-002, the connectors covered by this document support the highest Power over Ethernet level as defined by IEEE 802.3bt (100 W PoE++ Type 4).
Base documents:
48B/3230/CDV; prEN IEC 61076-3-122:2026