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IEC 60749-10:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

General information

Withdrawn from 27.04.2022
Directives or regulations
None

Standard history

Status
Date
Type
Name
27.04.2022
Main
13.08.2003
Corrigendum
Modification of the validity date: now put at 2007.

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