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prEN IEC 63378-4:2026

Thermal standardization on semiconductor packages - Part 4: Thermal evaluation board specifications for fine pitch semiconductor packages

General information

Draft
Base Documents
47D/1003/CDV; prEN IEC 63378-4:2026
Directives or regulations
None
You can view draft standards in the Commenting portal🡭.

Standard history

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This part of IEC 63378 specifies thermal evaluation board specifications for fine pitch semiconductor packages.
Fine pitch is defined as 0,8 mm or less solder pitch for both BGA and LGA and 0,5 mm or less solder pitch for QFP.
Semiconductor packages are mounted on this thermal evaluation board using solder and then thermal resistance and thermal parameter of the packages are measured.
The obtained thermal resistance and thermal parameter are listed in the datasheets of semiconductor packages.

Required fields are indicated with *

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Standard monitoring