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prEN IEC 63608-1:2026

Semiconductor devices - Reliability test methods for vibration energy harvesters - Part 1: Mechanical reliability under shock

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Alusdokumendid
47/3000/CDV; prEN IEC 63608-1:2026
Tegevusala (ICS grupid)
31.080.99 Muud pooljuhtseadised
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This document specifies test methods for the mechanical reliability of vibration energy harvesting devices. This standard applies to all vibration energy harvesting devices, regardless of size and power generation principle. The method includes shock, vibration, frequency sweep, and drop tests. Shock vibration covers a wide range of definitions, including its peak acceleration, duration/frequency, and the shape of the shock pulse (e.g., half-sine, square, sawtooth, etc.). According to typical usage conditions, the change in power is measured before and after the tests under conditions that include actual power management circuits or load resistances. Fatigue and long-term reliability are excluded.

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