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EVS-EN 60749-30:2005

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

General information

Withdrawn from 02.10.2020
Base Documents
IEC 60749-30:2005; EN 60749-30:2005
Directives or regulations
None

Standard history

Status
Date
Type
Name
02.10.2020
Main
03.08.2011
Amendment
05.06.2005
Main
Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation. These SMDs should be subjected to the appropriate preconditioning sequence described in this standard prior to being submitted to specific in-house reliability testing in order to evaluate long term reliability.

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