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EVS-EN 61326-2-1:2013

Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications (IEC 61326-2-1:2012)

General information
Valid from 05.02.2013
Base Documents
IEC 61326-2-1:2012; EN 61326-2-1:2013
Standard history
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prEN IEC 61326-2-1:2019
05.02.2013
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In addition to the scope of IEC 61326-1, this part of IEC 61326 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer. The manufacturer specifies the environment for which the product is intended to be used and selects the appropriate test level specifications of IEC 61326-1. NOTE Examples of equipment include, but are not limited to, oscilloscopes, logic analysers, spectrum analysers, network analysers, analogue instruments, digital multimeters (DMM) and board test systems
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