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IEC 60749-5:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

General information

Withdrawn from 10.04.2017
Directives or regulations
None

Standard history

Status
Date
Type
Name
10.04.2017
Main
Main
IEC 60749-5:2003
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

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Standard monitoring