Back

IEC 62416:2010

Semiconductor devices - Hot carrier test on MOS transistors

General information
Valid from 26.04.2010
Directives or regulations
None

Standard history

Status
Date
Type
Name
26.04.2010
Main
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
*
*
*
PDF
52.45 € incl tax
Paper
52.45 € incl tax
Standard monitoring