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IEC 62416:2010

Semiconductor devices - Hot carrier test on MOS transistors

General information
Valid from 26.04.2010
Directives or regulations
None
Standard history
Status
Date
Type
Name
26.04.2010
Main
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
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