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ISO 24173:2009

Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction

General information

Withdrawn from 09.02.2024
Directives or regulations
None

Standard history

Status
Date
Type
Name
09.02.2024
Main
14.09.2009
Main
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

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