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prEN IEC 60749-34-1:2023

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module

General information

Draft
Base Documents
47/2823/CDV; prEN IEC 60749-34-1:2023
ICS Groups
31.080.01 Semiconductor devices in general
Directives or regulations
None

Standard history

Status
Date
Type
Name
Main
prEN IEC 60749-34-1:2023
This part of IEC IEC 60749 describes a test method that is used to determine the capability of power semiconductor modules to withstand thermal and mechanical stress resulting from cycling the power dissipation of the internal semiconductors and the internal connectors. It is based on IEC 60749-34,
Power cycling, but is developed specifically for silicon-based power semiconductor module products.
This test causes wear-out and is considered destructive.

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Related products

Main

EVS-EN IEC 60747-5-5:2020

Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Newest version Valid from 02.10.2020
Main

EVS-EN 60749-34:2010

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Newest version Valid from 05.01.2011
Amendment

EVS-EN 60747-5-5:2011/A1:2015

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
Withdrawn from 02.10.2020
Main

EVS-EN IEC 60749-26:2018

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Newest version Valid from 02.04.2018

Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English