Skip to main content
Tagasi

EVS-EN 60749-10:2003

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Üldinfo

Kehtetu alates 15.06.2022
Alusdokumendid
IEC 60749-10:2002; EN 60749-10:2002
Direktiivid või määrused
puuduvad

Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
15.06.2022
Põhitekst
01.03.2003
Põhitekst
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

Nõutud väljad on tähistatud *

*
*
*
PDF
12,20 € koos KM-ga
Paber
12,20 € koos KM-ga
Sirvi standardit alates 2,44 € koos KM-ga
Standardi monitooring