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EVS-EN 60749-10:2003

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

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Kehtetu alates 15.06.2022
Alusdokumendid
IEC 60749-10:2002; EN 60749-10:2002
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Tüüp
Nimetus
15.06.2022
Põhitekst
01.03.2003
Põhitekst
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.
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