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EVS-EN 60749-32:2003/A1:2010

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

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Kehtiv alates 04.11.2010
Alusdokumendid
IEC 60749-32:2002/A1:2010; EN 60749-32:2003/A1:2010
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
04.11.2010
Muudatus
07.11.2003
Põhitekst
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating.  The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device
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